PIXE and ToF-SIMS analysis of streaker samplers filters
نویسندگان
چکیده
منابع مشابه
TOF-SIMS in Cosmochemistry
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement – both polarities in subsequent analyses, (b) high lateral resolution, (c) sufficient mass resolution for separation of ...
متن کاملApplied to TOF-SIMS Data
1 Vienna University of Technology, Institute of Chemical Engineering Laboratory for Chemometrics, Getreidemarkt 9/166, A-1060 Vienna, Austria [email protected], www.lcm.tuwien.ac.at 2 Vienna University of Technology, Institute of Statistics and Probability Theory Wiedner Hauptstrasse 8-10, A-1040 Vienna, Austria [email protected], www.statistik.tuwien.ac.at/public/filz 3 Max Pl...
متن کاملToF-SIMS PC-DFA analysis of prostate cancer cell lines
Three closely related cancer cell lines have been analysed with ToF-SIMS using a C60 + primary ion beam. Principal component-discriminant function analysis (PC-DFA) has been applied for spectral classification. Various spectral pre-processing methods are discussed and assessed for optimum discrimination of this data set. The sum-normalised PC-DFA spectral model produced sensitivities as high as...
متن کاملApplications of TOF-SIMS in Planetology
In planetology the analysis of micrometer-sized samples like, e.g., inclusions in meteorites, interplanetary dust, and presolar grains has become more and more important. This requires techniques with high lateral resolution, no or little sample destruction, and high sensitivity. To still obtain unbiased information on this kind of samples a technique or a suite of techniques has to be selected...
متن کاملTOF-SIMS: accurate mass scale calibration.
A study is presented of the factors affecting the calibration of the mass scale in time-of-flight secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using local calibration procedures achieve a rather poor relative mass accuracy of only 150 ppm for large molecules (647 u) whereas for smaller fragments of <200 u this figure only improves to 60 ppm. The instrumenta...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
سال: 2004
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2004.02.014